Analysis of Far Fields in an Electronic Device Through Circuit Parameters

This paper presents an analysis of electric fields radiated by an electronic device. In the application of the methodology a digital circuit with emitting source characteristics is projected. The field values generated by the digital circuit are calculated numerically and measured. The field calculations are performed through a methodology based on electrical circuit parameters and software based on the finite element method. In order to perform the measurements an electromagnetic transverse cell (GTEM) is employed.

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